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Characterization on Thin Films
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Characterization of thin films
MicroBAM
MicroBAM enables visualization of monolayers at the air-water interface in a Langmuir Trough.
Surface Potential Sensor
The KSV NIMA Surface Potential Sensor (SPOT) is used for determining molecular orientation changes in Langmuir films.
ISR Flip
Next-generation interfacial shear rheometer. Enables highly sensitive measurements of interfacial viscoelasticity at air-liquid/liquid-liquid interfaces.
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